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Easily scale for massive data growth with the excellent storage capacity, memory density and I/O capabilities of the PowerEdge™ R720xd rack server.
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PassMark Software recently conducted performance testing on eight security software products, on Windows 7 Ultimate Edition. View this white paper to uncover how the software performed in different areas. Each guideline is explained further in the resource.
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In order to help vSphere administrators make the knowledge leap between VMware vSphere and Microsoft Hyper-V, this paper will outline the differences between the currently shipping products from both VMware and Microsoft: vSphere 5.1 and Hyper-V 2012. Discover key features in the products and be exposed to the feature details as that may exist.
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This paper examines the root causes of memory errors and discusses and discusses the core concepts of technology designed to remediate and obviate these errors.
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LINQ is an acronym which stands for Language Integrated Query. This new technology comes built into the .NET Framework 3.5 and can be used with any of the different languages that run under .NET. This paper serves as an introduction.
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Steady increases in microprocessor operating frequencies and bus widths over recent years have challenged system designers to find FIFO memories that meet their needs.
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A virtualization platform can be very expensive. It's important to consider all costs included in the virtualization process to ensure a successful virtual environment. Read on to discover how the combination of two Red Hat operating systems will lower your total cost of ownership and increase your infrastructure value
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This white paper examines the defining reliability, availability, and serviceability characteristics of Red Hat Enterprise Linux. Learn how they enable the addition and removal of physical and logical devices while improving system availability and increasing capacity.
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By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.